Advanced Microscopy Centre
TEM
The transmission electron microscope (TEM) facility comprises of a JEOL
JEM-2100 LaB6 TEM.
The TEM is equipped with STEM facilities and a Princeton Gamma
Technology Avalon EDX system. The key features of the TEM are:
- Resolution: Point 0.25nm, Lattice 0.14nm, STEM 1.0nm
- Specimen Tilt: +/- 42˚
- Gatan 2k x 2k digital camera
- Instrument modes include:
- TEM
- Selected Area Diffraction
- Convergent Beam Diffraction
- STEM Bright Field
- STEM Dark Field
- EDS Probe
- X - Ray Mapping (With PGT)
- X - Ray Line Scan (With PGT)
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