Advanced Microscopy Centre
UHV VT STM
The UHV STM/AFM consists of an Omicron UHV VT STM/AFM with the
following features:
- in situ switching between STM and AFM
- simultaneous recording of tunnelling currents (STM mode) and
normal/lateral forces (AFM mode) with the same tip assembly.
- spatial resolution of 0.1Å in z and the x-y resolution
allows atomic scale images on Si(111) 7x7 to be obtained.
- Temperature range 25-1000K
- Operating pressure 2x10-10 mbar
In AFM mode the instrument modes are:
- Contact/Non-contact
- Lateral force microscopy
- Magnetic force microscopy
- Electrostatic force microscopy
In STM mode, the instrument modes are:
- Scanning Tunnelling Spectroscopy
- Scanning Tunnelling Imaging mode.
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