Advanced Microscopy Centre
FEGSEM
The FEGSEM facility is based on a FEI Sirion 200 which is a is an
ultra-high resolution Schottky field emission scanning electron
microscope and is ideal for studying materials on the nanometre
scale. The microscope is equipped with energy dispersive X-ray
analysis (EDX) and electron backscattered diffraction
(EBSD). The key
features of the FEGSEM are:
- immersion lens electron optics and in-lens detector
technology;
- high resolution secondary electron (SE) and back-scattered
electron (BSE) imaging;
- instrument resolution of 3.5nm at 500V, 2.5nm at 1kV and
1.5nm at 10kV.
- scanning transmission electron microscopy (STEM) detector
for bright-field and dark-field images of a TEM-prepared sample;
- ultra-high resolution analysis with the STEM detector (20 nm
spatial resolution EDX in STEM mode).
- Princeton Gamma Technology Spirit energy dispersive X-ray
analysis system with a 50mm2 germanium detector for light
element analysis at low accelerating voltages.
- HKL Technology Channel 5 EBSD system which will allow imaging,
diffraction pattern acquisition and indexing, phase identification,
orientation mapping, determination of pole figures, and orientation
distribution function calculations
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